3-D Technology Coming for Carry-On Bags at JFK

NEW YORK (AP) -

Travelers at Kennedy Airport will soon experience a test of more advanced, three-dimensional imaging to screen carry-on bags.

The Transportation Security Administration and American Airlines said Thursday that a test of computed-tomography scanners will start later this month at JFK’s Terminal 8. The machines let screeners manipulate 3-D images to get a better idea of what’s inside a bag.

TSA has been running similar tests in Phoenix and Boston since last year. The 3-D imaging scans checked bags, but until recently the scanners have been too large and heavy for use at security checkpoints. Instead, screeners use older X-ray technology to inspect carry-on bags.

TSA Administrator David Pekoske says 3-D scanning will improve security right away.